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STAR1000
STAR1000 1M Pixel Radiation Hard CMOS Image Sensor
Key Features
The STAR1000 sensor has the following characteristics: * Integrating 3-transistor Active Pixel Sensor. * 1024 by 1024 pixels on 15 m pitch. * Radiation tolerant design. * On-chip double sampling circuit to cancel Fixed Pattern Noise. * Electronic shutter. * Read out rate: up to 11 full frames per second. * Region Of Interest (ROI) windowing. * On-chip 10-bit ADC. * Programmable gain amplifier. * Ceramic JLCC-84 package. * Available with BK7G18 glass and with N2 filled cavity.
Sensor Description
The STAR1000 is a CMOS image sensor with 1024 by 1024 pixels on a 15 mm pitch. It features on-chip Fixed Pattern Noise (FPN) correction, a programmable gain amplifier, and a 10-bit Analog-to-Digital Converter (ADC). All circuits are designed using the radiation tolerant design rules for CMOS image sensors, to allow a high tolerance against total dose effects. Registers that are directly accessed by the external controller contain the X- and Y- addresses of the pixels to be read. This architecture provides flexible operation and allows different operation modes such as (multiple) windowing, subsampling, etc. Two versions od sensors are available: STAR1000 and STAR1000BK7. The STAR1000 has a quartz glass lid and the cavity between the die and the lid is filled with air. The STAR1000BK7 has a BK7G18 glass lid and the cavity is filled with N2 which increases the temperature operating range.
Cypress Semiconductor Corporation Document Number: 38-05714 Rev. *B
*
198 Champion Court
*
San Jose, CA 95134-1709 * 408-943-2600 Revised January 5, 2007
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Image Sensor Specifications
General Specifications Table 1. General Specification of the STAR1000 Sensor Parameter Detector technology Pixel structure Photodiode Sensitive area format Pixel size Pixel output rate Windowing Electronic shutter Total dose radiation tolerance Specification CMOS active pixel sensor 3-transistor active pixel High fill factor photodiode 1024 x 1024 pixels 15 x15 m2 12 MHz X- and Y- addressing random programmable Electronic rolling shutter. Range: 1:1024 > 250 Krad (Si) Integration time is variable in time steps equal to the row readout time. Pixel test structures with a similar design have shown total dose tolerance up to several Mrad. Note: Dark current and DSNU are dependent of radiation dose. Speed can be exchanged for power consumption. Radiation-tolerant pixel design. Using N-well technique. Comment
Proton radiation tolerance SEU tolerance Electro-optical Specifications
2,4.1011 proton/cm2 At 60 MeV > 127,8 MeV cm3 mg-1
Table 2. Electro-optical Specifications of the STAR1000 Sensor Value Parameter Typical Value Spectral range Quantum efficiency x fill factor Full well capacity Saturation capacity to meet non-linearity within + 5% Output signal swing Conversion gain kTC noise Dynamic range Fixed pattern noise 400 - 1000 20% 135.000 99.000 eeUnit nm Average over the visual range. See spectral response curve. Comment
1.1 11.4 47 69 Local: 1 < 0.30% Global: 1 <0.56% of full well Local: 1 < 0.67% Global: <3.93% of full well
V V/eedB
Photo response non-uniformity at Sat/2 (RMS)
Document Number: 38-05714 Rev. *B
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Table 2. Electro-optical Specifications of the STAR1000 Sensor (continued) Value Parameter Typical Value Average dark current at 293K Dark current signal DSNU signal Optical cross-talk at 600 nm Anti-blooming capacity Output amplifier gain Analogue input bandwidth Analogue input signal range Analog-to-Digital converter ADC Differential Non-Linearity (DNL) ADC Integral Non-Linearity (INL) Supply voltage Power dissipation 223 3135 1.055% of Vsat Vertical: 16% Horizontal: 17.5% x 1000 x1, x2.47, x4.59 and x8.64 9.5 0.1 to 4.9 10 <= 3.5 <= 5.8 5 < 350 < 100 MHz V bit LSB LSB V mW Integral non-linearity of ADC is better than linearity of image sensor. Digital input signals are 3.3V compatible. With internal ADC powered. Without internal ADC powered. Both values measured at nominal speed (12 MHz). Radiation-tolerant version of the ADC on Ibis4 and other image sensors. Controlled by 2 bits. Unit A/cm2 e-/s Dark current rises 425 e-/s per Krad. DSNU rises 14 e-/s per Krad. Comment
Document Number: 38-05714 Rev. *B
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Spectral Response Figure 1. Spectral Response Curve
0.16
QE 0.3
0.14
QE 0.2
0.12
Spectral response [A/W]
0.1
0.08
QE 0.1
0.06
0.04
QE 0.05
0.02
QE 0.01
0 400
500
600
700
800
900
1000
Wavelenght [nm]
Photo-Voltaic Response Figure 2. Photo Voltaic Response Curve
1,2 1 0,8 0,6 0,4 0,2 0 0 20000 40000 60000 80000 100000 120000 140000 160000 180000 Number of electrons
Document Number: 38-05714 Rev. *B
Voltage swing at output [V]
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Absolute Maximum Ratings Table 3. Absolute Maximum Ratings STAR1000 Limits Characteristics Min Any supply voltage Voltage on any input terminal Operating temperature Storage temperature Sensor soldering temperature -0.5 -0.5 0 -10 NA Max +7 Vdd + 0.5 +60 +60 125 V V C C C Temperature range confirmed by evaluation testing. Not longer than 1 hour. Temperature range confirmed by evaluation testing. Hand soldering only. The sensor's temperature may not rise above this limit. Please read the soldering and handling section for more information. R Units Remarks
Table 4. Absolute Maximum Ratings STAR1000BK7 Limits Characteristics Min Any supply voltage Voltage on any input terminal Operating temperature Storage temperature -0.5 -0.5 -40 -40 -40 Sensor soldering temperature NA Max +7 Vdd + 0.5 +85 +85 +120 125 C V V C C Temperature range confirmed by evaluation testing. Temperature range confirmed by evaluation testing. Maximum 1 hour. Hand soldering only. The sensor's temperature may not rise above this limit. Please read the soldering and handling section for more information. Units Remarks
Document Number: 38-05714 Rev. *B
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DC Operating Conditions Table 5. DC Operating Conditions Limits Symbol VDDA VDDD VDD_ADC_ANA VDD_ADC_DIG VDD_DIG_OUT VRES VREF GNDA GNDD GND_ADC_ANA GND_ADC_DIG VIH VIL VOH VOL Parameter Min Analog supply of the image core. Digital supply of the image core. Analog supply of the ADC circuitry. Digital supply of the ADC circuitry. Power supply of ADC digital output stage. Reset level for RESET signal. Reset level for RESET_DS signal. Analog ground of the image core. Digital ground of the image core. Analog ground of the ADC circuitry. Digital ground of the ADC circuitry. Logical '1' input voltage. Logical '0' input voltage. Logical '1' output voltage. Logical '0' output voltage. 1.8 0 4.25 4 0 0 0 0 VDDD 1 VDDD 1 Typ 5 5 5 5 5 5 5 Max V V V V V V V V V V V V V V V Units
Document Number: 38-05714 Rev. *B
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Architecture
Floor Plan Figure 3. STAR1000 Floor Plan
Reset Reset_DS Vref Ld_Y 10 Latch A0....A9 Y Address Decoder and Logic Rst 1024 Pixel Array 1024 x 1024 pixels 10
D0...D9
Col 1024 Rst Rd Rd
10-bit ADC Clk_ADC
Ain
1024 10
S R 1024
Column Amplifiers 1024 1024 Rst Sig Progr. Gain Amplifier Multiplexer Buffer Aout
Clk_X 1024 10
X Register
X Address Decoder Latch
Ain1 Ain2 Ain3
Blackref Cal
Ld_X
The image sensor contains five sections: the pixel array, the X- and Y- addressing logic, the column amplifiers, the output amplifier and the ADC. Figure 3. shows an outline diagram of the sensor, including an indication of the main control signals. The following paragraphs explain in more detail the function and operation of the different imager parts. Pixel Array The pixel array contains 1024 by 1024 active pixels at 15 m pitch. Each pixel contains one photo diode and three transistors (Figure 4.). The photo diode is always in reverse bias. At the beginning of the integration cycle, a pulse is applied to the reset line (gate of T1) bringing the cathode of D1 to the reset voltage level. During the integration period, photon-generated electrons accumulate on the diode capacitance reducing the voltage on the gate of T2. The real illumination dependent signal is the difference between the reset level and the output level after integration. This difference is created in the column amplifiers. T2 acts as a source follower and T3 allows connection of the pixel signal (reset level and output level) to the vertical output bus. Document Number: 38-05714 Rev. *B
The reset lines and the read lines of the pixels in a row are connected together to the Y- decoder logic; the outputs of the pixels in a column are connected together to a column amplifier. Figure 4. Architecture of the 3T Pixel
T1 Read Reset T2 Column Bus
Sel0
Sel1
G0f G1
T3
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Addressing Logic The addressing logic allows direct addressing of rows and columns. Instead of the one-hot shift registers that are often used, address decoders are implemented. One can select a line by presenting the required address to the address input of the device and latching it to the Y- decoder logic. Presenting the X- address to the device address input and latching it to the X- address decoder can select a column. A typical line read out sequence will first select a line by applying the Y-address to the Y-decoder. Activation of the LD_Y input on the Y-logic connects the pixel outputs of the selected line to the column amplifiers. The individual column amplifier outputs are connected to the output amplifier by applying the respective X- addresses to the X- address decoder. Applying the appropriate Y- address to the Ydecoder and activating the "Reset" input reset a line. The integration time of a row is the time between the last reset of this row and the time when it is selected for read out. The Y- decoder logic has two different reset inputs: RESET and RESET_DS. Activation of RESET resets the pixel to the Vdd level; activation of RESET_DS resets the pixel to the voltage level on the VREF input. This feature allows the application of the so called dual slope integration. If dual slope integration is not needed, VREF is tied to Vdd and RESET_DS must never be activated. Column Amplifiers All outputs from the pixels in a column are connected in parallel to a column amplifier. This amplifier samples the output voltage and the reset level of the pixel whose row is selected at that moment and presents these voltage levels to the output
amplifier. As a result, the pixels are always reset immediately after read out as part of the sample procedure. Note that the maximum integration time of a pixel is the time between two read cycles. Output Amplifier and Analog Multiplexer The output amplifier combines subtraction of pixel signal level from reset level with a programmable gain amplifier. Since the amplifier is AC coupled, it also contains a provision to maintain and restore the proper DC level. An analog signal multiplexing feeds the pixel signal to the final unity gain buffer, providing the required drive capability. Apart from the pixel signal, three other external analog signals can be fed to the output buffer. All these signals can be digitalised by the on-chip ADC if the output of this buffer is externally connected to the input of the ADC. The purpose of the additional analog inputs (A_IN1, A_IN2, and A_IN3) is to allow the possibility of processing other analog signals through the image sensors signal path. These signals can then be converted by the ADC and processed by the image controller FPGA. The additional analog inputs are intended for low frequency or DC signals and have a reduced bandwidth compared with the image signal path. ADC The image sensor has a 10-bit ADC that is electrically separated from the rest of the image sensor circuits and can be powered down if an external ADC is used. The conversion takes place at the falling edge of the clock and the output pins can be disabled to allow operation of the device in a bus structure.
Document Number: 38-05714 Rev. *B
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Timing and Control Signals
The pixels addressing is done by direct addressing of rows and columns. This approach has the advantage of full flexibility when accessing the pixel array: multiple windowing and subsampled read out are possible by proper programming. The following paragraphs clarify the timing for row and column readout.
Row Selection and Reset Timing Figure 5. shows the timing of the line sequence control signals. The timing constraints are presented in Table 6. The address, presented at the address IO pins (A0...A9) is latched in with the LD-Y pulse (active low). After latching; the external controller already produces a new address.
Figure 5. Line Selection and Reset Sequence
A0......A9
Read Address
Reset Address
k LD_Y
l
m
k
l
m
INTERNAL
Row Selected for Readout
Row Selected for Reset
a b S c f d RESET d
g
e b R h CAL (Once each frame) i
ROW READOUT
Time Available for Readout of Row Y-1
Idle
Time Available for X-readout of Row Y
Latching in a Y- address selects the addressed row and connects the pixel outputs of that row to the column amplifiers. Through the sequence of the S and R pulse and the reset pulse in between the pixel output signal and reset level are
sampled and produced at the output of the column amplifier (to do the FPN double sampling correction). At this time horizontal read out of the selected row is started and another row is reset to effectuate reduced integration time (electronic rolling shutter).
Document Number: 38-05714 Rev. *B
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Table 6. Timing Constraints of Line Sequence Symbol a Min 3.6 s Typ Description Delay between selection of a new row and falling edge on S. Minimal value: For maximum, speed a new row can already be selected during X- read out of the previous row. Duration of S and R pulse. 100 ns Delay between falling edge of S and rising edge of reset. Minimum duration of reset pulse. Delay between falling edge of reset and falling edge of R. 100 ns g 100 ns 100 ns 10 ns 20 ns 10 ns 200 ns 1 s Minimum delay between falling edge on LD_Y and rising edge of reset. Minimum required extension of Y- address after falling edge of reset pulse. Position of cal pulse after rising edge of S. The cal pulse must only be given once per frame. Duration of cal pulse. Address set up time. Load register value. Address stable after load. The ADC conversion starts at the falling edge of the CLK-ADC signal and produces a valid digital output 20 ns after this edge. The timing constraints are given in Table 7. Important note: The values of the X shift-register tend to leak away after a while. Therefore it is very important to keep the CLK_X signal asserted for as long as the sensor is powered up. If the sensor sits idle and CLK_X is not asserted, the leakage of the X shift-register will cause multiple columns to be selected at once. This forces high current through the sensor and may cause damage.
b c d e f g h i k l m
0.4 s 0 200 ns 1.6 s 0
Pixel Read Out Timing Figure 6. shows the timing of the pixel readout sequence. The external digital controller presents a column address that is latched by the rising edge of the LD_X pulse. After decoding the X- address the column selection is clocked in the Xregister by CLK-X. The output amplifier uses the same pulse to subtract the pixel output level from the pixel reset level and the signal level. This causes a pipeline effect such that the analog output of the first pixel is effectively present at the device output terminal at the third rising edge of the X-CLK signal.
Document Number: 38-05714 Rev. *B
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Figure 6. Column Selection and Read Out Sequence
A0......A9 Row Idle Time X1 X2 X3 X4 X5 X6 X7 X8
LD_X
a
b
CLK_X
X1 ANALOG OUTPUT Undefined Output Level
X2
X3
X4
X5
X6
CLK_ADC c
D9......D0
X1
X2
X3
X4
Table 7. Timing Constraints of Column Read Out Symbol a b c Min 20 ns 40 ns 0 20 ns Typ Address setup time. Address valid time. ADC output valid after falling edge of CLK_ADC. Description
Document Number: 38-05714 Rev. *B
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Pin List
Figure 7. displays the pin connections of the STAR1000. The tables that follow group the connections by their functionality. Figure 7. STAR1000 Pin Connections
Table 8. Pin List of the STAR1000 Sensor Pin 1 2 3 4 5 6 7 8 Pin Name A3 A4 A5 A6 A7 A8 A9 LD_Y Pin Type Input Input Input Input Input Input Input Input Digital Input. Latch address (A0...A9) to Y-register (0 = track, 1 = hold). Page 12 of 21 Pin Description Digital input.Address inputs for row and column addressing. A9=LSB, A0=MSB.
Document Number: 38-05714 Rev. *B
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Table 8. Pin List of the STAR1000 Sensor (continued) Pin 9 10 11 12 13 14 Pin Name LD_X VDDA GNDD GNDA CLK_X RESET_DS Pin Type Input Supply Ground Ground Input Input Pin Description Digital input. Latch address (A0...A9) to X-register (0 = track, 1 = hold). Analog power supply of the imager (typical 5V). Digital ground of the imager. Analog ground of the imager. Digital input. Clock X-register (output valid & stable when CLK_X is high). Digital input (high active). Resets row indicated by Y-address (see sensor timing diagram). RESET_DS is used for dual-slope integration (see FAQ). GND is used for normal operation. Digital supply of the image sensor. Digital input (high active). Resets row indicated by Y-address (see sensor timing diagram). Digital input (high active). Control signal for column amplifier (see sensor timing diagram). Digital input (high active). Control signal for column amplifier (see sensor timing diagram). Analog input. Biasing of address decoder. Connect with 100 k to VDDA and decouple with 100 to GND. Additional analog inputs. For proper conversion with on-chip ADC, the input signal must lie within the output signal range of the image sensor (approximately +2V to +4V).
15 16 17 18 19 20 21 22 23 24 25
VDDD RESET S R NBIAS_DEC A_IN2 A_IN3 A_IN1 A_SEL1 A_SEL0 NBIAS_OAMP
Supply Input Input Input Input Input Input Input Input Input Input
Selection of analog channel: '00' selects image sensor ('01' selects A_IN1, '10' A_IN2, and '11' A_IN3). Analog input. Bias of output amplifier (speed/power control). Connect with 100 k to VDDA and decouple with 100 nF to GND for 12.5 MHz output rate (lower resistor values yield higher maximal pixel rates at the cost of extra power dissipation). Analog input. Biasing of the multiplexer circuitry. Connect with 20 k to GND and decouple with 100 nF to VDD. Digital input. Select output amplifier gain value: G0 = LSB, G1 = MSB ('00' = unity gain, '01' = x2, '10'= x4, '11'=x8). Digital input (active high). Initialization of output amplifier. Output amplifier outputs BLACKREF in unity gain mode when CAL is high (1). Apply pulse pattern (see sensor timing diagram). Analog Output Video Signal. Connected to the analog input of the internal (pin 52) 10-bit ADC or an external ADC. Analog input. Control voltage for output signal offset level. Buffered on-chip, the reference level can be generated by a 100 k resistive divider. Connect to 2V DC for use with on-chip ADC. Analog power supply of image core (typical 5V). Digital power supply of image core (typical 5V).
26 27 28 29
PBIAS G1 G0 CAL
Input Input Input Input
30 31
OUT BLACKREF
Output Input
32 33
VDDA VDDD
Supply Supply
Document Number: 38-05714 Rev. *B
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Table 8. Pin List of the STAR1000 Sensor (continued) Pin 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 Pin Name GNDA GNDD NBIAS_ARRAY TESTPIX_OUT TESTPIX_RESET n.c. n.c. n.c. n.c. n.c. n.c. n.c. n.c. n.c. TESTPIXARRAY PHOTODIODE NBIAS_ANA NBIAS_ANA2 IN_ADC Output Output Input Input Input Analog output of an array of 20 x 35 test pixels where all photodiodes are connected in parallel. Is used for electro-optical evaluation. Plain Photo Diode (without circuitry). Area of the photodiode = 20 x 35 pixels. Is used for electro-optical evaluation. Analog input. Analog biasing of the ADC circuitry. Connect with 100 k to VDDA and decouple with 100 nF to GND. Analog input of the internal ADC. Connect to analog output of image sensor (pin 30). Input range (typically 2V and 4V) of the internal ADC is set between by VLOW_ADC (pin 55) and VHIGH_ADC (pin 62). Analog power supply of the ADC (typical 5V). Analog ground of the ADC. Low reference voltage of internal ADC. Nominal input range of the ADC is between 2V and 4V. The resistance between VLOW_ADC and VHIGH_ADC is approximately 1.5 k. Connect with 1k 5 to GND and decouple with 100 nF to GND. Pin Type Ground Ground Input Output Input Pin Description Analog ground of image core. Digital ground of image core. Analog input. Biasing of the pixel array. Connect with 1M to VDDA and decouple with 100 nF capacitor to GND. Output of single test pixel. Is used for electro-optical evaluation. Digital input (active high). Reset signal of single test pixel. Used to reset the single test pixel during electro-optical evaluation.
53 54 55
VDD_ADC_ANA GND_ADC_ANA VLOW_ADC
Supply Ground Input
56 57 58 59 60 61
n.c. PBIASDIG2 BITINVERT TRI_ADC D0 CLK Input Input Input Input Input Connect with 20K to GND and decouple with 100 nF to VDDA. Digital input. Inversion of the ADC output bits. 0 = invert output bits (0 => black, 1023; white, 0), 1 = no inversion of output bits (black, 0; white, 1023). Digital input. Tri-state control of digital ADC outputs (1 = tri-state, 0 = normal mode). ADC output bits.#D0 = LSB, D9=MSB. Digital input. ADC clock. ADC converts on falling edge.
Document Number: 38-05714 Rev. *B
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Table 8. Pin List of the STAR1000 Sensor (continued) Pin 62 Pin Name VHIGH_ADC Pin Type Input Pin Description High reference voltage of internal ADC. Nominal input range of the ADC is between 2V and 4V. The resistance between VLOW_ADC and VHIGH_ADC is about 1.5 k. Connect with 1k 1 to VDDA and decouple with 100 nF to GND. Analog ground of the ADC circuitry. Analog supply of the ADC circuitry (typical 5V). Digital supply of the ADC circuitry (typical 5V). Digital ground of the ADC circuitry. Power supply of ADC digital output. Connect to 5V for normal operation. Can be brought to lower voltage when image sensor must be interfaced to low voltage periphery. ADC output bits. #D0 = LSB, D9=MSB.
63 64 65 66 67
GND_ADC_ANA VDD_ADC_ANA VDD_ADC_DIG GND_ADC_DIG VDD_DIG_OUT
Ground Supply Supply Output Supply
68 69 70 71 72 73 74 75
D1 D2 D3 D4 D5 VDDA GNDA GND_AB
Output Output Output Output Output Supply Ground Supply
Analog supply of the image core (typical 5V). Analog ground of the image core (typical 5V). Anti-blooming drain control voltage. Default: connect to ground where the anti-blooming is operational but not maximal. Apply 1V DC for improved anti-blooming. Analog supply. Reset level for RESET_DS. Is used for extended optical dynamic range. See FAQ for more details. Analog supply. Reset level for RESET (typical 5V). ADC output bits.#D0 = LSB, D9=MSB.
76 77 78 79 80 81 82 83 84
VREF VRES D6 D7 D8 D9 A0 A1 A2
Supply Supply Output Output Output Output Input Input Input
Digital input. Address inputs for row and column addressing. A9=LSB, A0=MSB.
Notes 1. All pins with the same name can be connected together. 2. Unused inputs must always be tied to an appropriate level, e.g., VDD or GND. 3. Note on power up behavior: At power on, the image sensor is in an undefined state. It is advised that after start up an address is latched as soon as possible into the Y- decoder and the X- decoder to prevent high current consumption. 4. There is no on-chip power supply rejection. This means that every noise signal on the analog supply voltages is copied directly to the analog video signal (decoupling of the supply voltages as close as possible to the image sensor is recommended).
Document Number: 38-05714 Rev. *B
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Packaging and Geometrical Constraints
Package Drawing The detector is packaged in an 84-pin J-leaded package. The detector is mounted into position with thermally and electrically conductive adhesive. The bottom plate of the cavity is electrically connected to a ground pin.
The detector is positioned into the cavity such that the optical center of the detector coincides with the geometrical center of the cavity within a tolerance of 50 m in X- and Y direction. The tolerance on the parallelism of the detector is 50 m in X- and Y- direction. Note: The dimensions in Figure 8.are in inches.
Figure 8. Package Drawing
Document Number: 38-05714 Rev. *B
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Die Alignment Figure 9. Die Alignment
Parallelism in X and Y within + 50 mm
200
Y Pin 1 Centre of Cavity and of FPA X Offset Between Centre of Silicium and Centre of Cavity: X: 52 m Y: 200 m
Centre of Silicium A
A
52
Bonding Cavity: 0.508+0.051 Die Cavity: 0.508+0.051
Die: 0.508+0.01
Glass Window: 1.0+/-0.05 Window Adhesive: 0.08+0.02
ASection A
Die Adhesive: 0.08+0.02
Drawing Not to Scale
Glass Lids There are 2 glass lid versions available: * STAR1000 - Quartz glass with air inside the cavity * STAR1000BK7 - BK7G18 glass with N2 inside the cavity
Document Number: 38-05714 Rev. *B
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Soldering and Handling
Soldering and Handling Conditions Take special care when soldering image sensors onto a circuit board. Prolonged heating at elevated temperatures may result in deterioration of the performance of the sensor. The following recommendations are made to ensure that sensor performance is not compromised during end users' assembly processes. Board Assembly The STAR250 is very sensitive to ESD. Device placement onto boards should be done in accordance with strict ESD controls for Class 0, JESD22 Human Body Model, and Class A, JESD22 Machine Model devices. Assembly operators need to always wear all designated and approved grounding equipment; grounded wrist straps at ESD protected workstations are recommended including the use of ionized blowers. All tools should be ESD protected. Manual Soldering When a soldering iron is used the following conditions should be observed: Table 9. Chemical Substances in STAR250 Sensor Chemical Substance Lead Cadmium Mercury Hexavalent chromium PBB (Polybrominated biphenyls) PBDE (Polybrominated diphenyl ethers) Information on Lead Free Soldering The product cannot withstand a lead free soldering process. Reflow or wave soldering Is not recommended. Hand soldering is needed for this part type. Solder 1 pin on each side and let the sensor cool down for minimum 1 minute before continuing. Note: "Intentional content" is defined as any material demanding special attention is contained into the inquired product by these cases: 1. A case that the above material is added as a chemical composition into the inquired product intentionally in order
Use a soldering iron with temperature control at the tip. The soldering iron tip temperature should not exceed 350C. The soldering period for each pin should be less than five seconds. Reflow Soldering Reflow soldering is not allowed. Precautions and Cleaning Avoid spilling solder flux on the cover glass; bare glass and particularly glass with antireflection filters may be harmed by the flux. Avoid mechanical or particulate damage to the cover glass. Use isopropyl alcohol (IPA) as a solvent for cleaning the image sensor glass lid. When using other solvents, it should be confirm whether the solvent will dissolve the package and/or the glass lid. RoHS (lead free) Compliance This paragraph reports the use of Hazardous chemical substances as required by the RoHS Directive (excluding packing material).
Any intentional content NO NO NO NO NO NO
If there is any intentional content, in which portion is it contained? -
to produce and maintain the required performance and function of the intended product 2. A case that the above material, which is used intentionally in the manufacturing process, is contained in or adhered to the inquired product. The following case is not treated as "intentional content": A case that the above material is contained as an impurity into raw materials or parts of the intended product. The impurity is defined as a substance that cannot be removed industrially, or it is produced at a process like chemical composing or reaction and it cannot be removed technically.
Document Number: 38-05714 Rev. *B
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Ordering Information
Table 10. Ordering Information FillFactory Part Number STAR1000 STAR1000-BK7 Disclaimer FillFactory image sensors are only warranteed to meet the specifications as described in the production data sheet. Cypress Part Number CYIS1SM1000AA-HQC CYIS1SM1000AA-HHC Package 84-pin JLCC 84-pin JLCC Glass Lid Quartz BK7G18 Mono/Color Mono Mono
FillFactory reserves the right to change any information contained herein without notice. Please contact info@FillFactory.com for more information.
Document Number: 38-05714 Rev. *B
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APPENDIX A: STAR1000 Evaluation System
For evaluating purposes, a STAR1000 evaluation kit is available. The STAR1000 evaluation kit consists of a multifunctional digital board (memory, sequencer, and IEEE 1394 Fire Wire interface) and an analog image sensor board.
Visual Basic software (under Windows 2000 or XP) allows the grabbing and display of images from the sensor. All acquired images can be stored in different file formats (8 or 16-bit). All settings can be adjusted dynamically to evaluate the sensors specs. Default register values can be loaded to start the software in a desired state.
All products and company names mentioned in this document may be the trademarks of their respective holders.
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(c) Cypress Semiconductor Corporation, 2006. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges.
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Document History Page
Document Title: STAR1000 1M Pixel Radiation Hard CMOS Image Sensor Document Number: 38-05714 REV. ** *A *B ECN NO. 310213 603177 649371 ISSUE DATE SEE ECN SEE ECN SEE ECN ORIG. OF CHANGE SIL QGS FPW DESCRIPTION OF CHANGE Initial Cypress release Converted to Framemaker Format Package spec label update + ordering information update
Document Number: 38-05714 Rev. *B
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